Testing: Academic & Industrial Conference - Practice And Research Techniques
TAIC PART Home Page
TAIC PART 2007: Windsor, UK
TAIC PART 2007 Home Page
TAIC PART 2006: Windsor, UK
Phil McMinn (Ed.):
Testing: Academia and Industry Conference - Practice And Research Techniques (TAIC PART 2006), 29-31 August 2006, Windsor, United Kingdom.
IEEE Computer Society 2006, ISBN 0-7695-2672-1
Contents 
Copyright © Mon Mar 15 03:55:20 2010
by Michael Ley (ley@uni-trier.de)
